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Optical Engineering

High-accuracy distance measurements with multiple-wavelength interferometry
Author(s): Rene Daendliker; Kurt Hug; Jacob Politch; Eric Zimmermann
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Paper Abstract

Multiple-wavelength interferometry is, like classical interferometry, a coherent method, but it offers great flexibility in sensitivity by an appropriate choice of the different wavelengths and it can be operated on rough surfaces. The accuracy of this method depends essentially on the signal processing and on the properties of the source. Practical considerations for distances in the range of several meters with micrometer resolution are given.

Paper Details

Date Published: 1 August 1995
PDF: 6 pages
Opt. Eng. 34(8) doi: 10.1117/12.205665
Published in: Optical Engineering Volume 34, Issue 8
Show Author Affiliations
Rene Daendliker, Univ. of Neuchatel (Switzerland)
Kurt Hug, Univ. of Neuchatel (Switzerland)
Jacob Politch, Univ. of Neuchatel (Switzerland)
Eric Zimmermann, Univ. of Neuchatel (Switzerland)

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