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Optical Engineering

PLZT modulator characterization
Author(s): Dennis H. Goldstein
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Paper Abstract

A commercial PLZT modulator is characterized at wavelengths from 0.6328 μm to the limits of its IR transmission around 9 μm. Laser polarimetry and IR spectropolárimetry are the characterization techniques used. Polarization measurement results include diattenuation and retardation. The PLZT modulator is found to be an electrically controllable polarizer as well as an electrically controllable retarder.

Paper Details

Date Published: 1 June 1995
PDF: 4 pages
Opt. Eng. 34(6) doi: 10.1117/12.202106
Published in: Optical Engineering Volume 34, Issue 6
Show Author Affiliations
Dennis H. Goldstein, Air Force Wright Lab. (United States)

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