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Optical Engineering

Polarization errors associated with birefringent waveplates
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Paper Abstract

Although zero-order quartz waveplates are widely used in instrumentation that needs good temperature and field-of-view characteristics, the residual errors associated with these devices can be very important in high-resolution polarimetry measurements. How the field-of-view characteristics are affected by retardation errors and the misalignment of optic axes in a double-crystal waveplate is discussed. The retardation measurements made on zero-order quartz and single-order "achromatic" waveplates and how the misalignment errors affect those measurements are discussed.

Paper Details

Date Published: 1 June 1995
PDF: 7 pages
Opt. Eng. 34(6) doi: 10.1117/12.202079
Published in: Optical Engineering Volume 34, Issue 6
Show Author Affiliations
Edward A. West, NASA Marshall Space Flight Ctr. (United States)
Matthew H. Smith, NASA Marshall Space Flight Ctr. (United States)


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