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Optical Engineering

Mechanics of polarization ray tracing
Author(s): Russell A. Chipman
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Paper Abstract

Polarization ray tracing is a collection of methods that extends geometrical ray tracing allowing the calculation of the evolution of polarization states along ray paths and the determination of the intrinsic polarization properties, such as diattenuation and retardance, associated with ray paths. The suitability of the Jones, Mueller, and threedimensional polarization ray tracing calculi are compared, examining the issues of local versus global coordinates, amplitude versus phase representations, inclusion of the wavefront aberration function, partially polarized light, measurements of images by polarimeters, and diffraction image formation by low- and high-numerical-aperture beams.

Paper Details

Date Published: 1 June 1995
PDF: 10 pages
Opt. Eng. 34(6) doi: 10.1117/12.202061
Published in: Optical Engineering Volume 34, Issue 6
Show Author Affiliations
Russell A. Chipman, Univ. of Alabama in Huntsville (United States)

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