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Optical Engineering

Characterization of active waveguide photonic devices using optical coherence domain reflectometry
Author(s): Bruce D. Patterson
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Paper Abstract

Internal reflections occurring in the waveguides of incoherently emitting photonic devices are mapped using a novel optical coherence domain reflectometry (OCDR) technique, where the light source is the device itself. Such reflections may be caused by cleaved facets, inadvertent waveguide defects, or mntentmonal submicrometer structures. How this OCDR technique is applied to the characterization of a 1.3-μm superluminescent diode with unintentional defects and with isolated and periodic structures produced by focused-ion beam milling is described. A two-pole network theory is used to model the observed effects.

Paper Details

Date Published: 1 August 1995
PDF: 10 pages
Opt. Eng. 34(8) doi: 10.1117/12.200609
Published in: Optical Engineering Volume 34, Issue 8
Show Author Affiliations
Bruce D. Patterson, Paul Scherrer Institute (Switzerland)

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