Share Email Print
cover

Optical Engineering

Smart sensing using custom photo-application-specific integrated circuits and charge-coupled device technology
Author(s): Peter Seitz; Thomas Spirig; Oliver Vietze; Kai Engelhardt
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Modern semiconductor technologies make it possible to fabricate photosensors whose geometry and functionality are adapted to specific sensing tasks of various optical measurement techniques. Several such smart sensors, realized with commercially available CMOS/CCD processes, have been demonstrated successfully in different optical sensing applications: (1) a novel absolute position encoder with 10-nm resolution and 50-nm differential accuracy, (2) a dynamic CCD image sensor whose pixel size and shape can be varied in real time, (3) an image sensor capable of carrying out convolutions with arbitrary kernel sizes on-chip and during the exposure, and (4) a 2-D, synchronous detector/demodulator ("lock-in CCD") for applications in heterodyne interferometry and time-of-flight (laser-radar) depth imaging. Several of these devices and techniques rely on dynamic, real-time clocking schemes, for which a universal smart sensor controller was developed, capable of controlling and driving almost any existing CCD/CMOS image sensor at clock rates of up to 25 MHz. The availability of design and fabrication facilities for custom photosensors and imagers, produced quickly and quite inexpensively even in prototype quantities, opens up new possibilities for a wide range of traditional and novel optical measurement techniques.

Paper Details

Date Published: 1 August 1995
PDF: 10 pages
Opt. Eng. 34(8) doi: 10.1117/12.200595
Published in: Optical Engineering Volume 34, Issue 8
Show Author Affiliations
Peter Seitz, Paul Scherrer Institut (Switzerland)
Thomas Spirig, Paul Scherrer Institut (Switzerland)
Oliver Vietze, Paul Scherrer Institut (Switzerland)
Kai Engelhardt, Paul-Scherrer Institute (Switzerland)


© SPIE. Terms of Use
Back to Top