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Optical Engineering

Neural network step-frequency fault locator
Author(s): Satoshi Fujii; Keigo Iizuka
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Paper Abstract

A step-frequency fault locator was constructed as a new diagnostic tool for integrated optics devices. The wavelength of the light was swept stepwise from 1.5 to 1.6 μm in steps less than 1 nm. The image of the target was processed using a neural network algorithm. Detailed comparisons between the results using the neural network algorithm and FFT algorithm have been presented. Obtained resolution was of the order of microns. The overall dimensions were reduced to 7 x l0 x 2 in. by replacing bulk optic elements with fiber-optic elements.

Paper Details

Date Published: 1 May 1995
PDF: 9 pages
Opt. Eng. 34(5) doi: 10.1117/12.199888
Published in: Optical Engineering Volume 34, Issue 5
Show Author Affiliations
Satoshi Fujii, Okinawa Radio Observatory (Japan)
Keigo Iizuka, Univ. of Toronto (Canada)


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