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Optical Engineering

Partially coherent transmittance of dielectric lamellae
Author(s): Erich N. Grossman; Donald G. McDonald
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Paper Abstract

We derive an analytic formula for the transmittance of a dielectric amelia when the interference between successive internal reflections is only partially spatially coherent. This allows effects such as surface roughness and nonparallelism, which produce cumulative distortions in the phase front with each reflection, and which result in a loss of fringe contrast at high frequencies, to be accounted for quantitatively. The transmittance of a Si lamella, measured with a Fourier-transform interferometer over the range 20 to 1000 cm-1 agrees with our formula to within the accuracy of the data, which is dominated by systematic instrumental effects.

Paper Details

Date Published: 1 May 1995
PDF: 7 pages
Opt. Eng. 34(5) doi: 10.1117/12.199887
Published in: Optical Engineering Volume 34, Issue 5
Show Author Affiliations
Erich N. Grossman, National Institute of Standards and Technology (United States)
Donald G. McDonald, National Institute of Standards and Technology (United States)


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