Share Email Print
cover

Optical Engineering

Polarizational reflectometers for realization of the method of combined ellipsometric parameters
Author(s): Petro I. Drozd; Leonid V. Poperenko; Vasiliy V. Prorok; Igor A. Shaykevich
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The construction of two novel double-beam polarizational devices for the realization of the combined ellipsometric parameter method for solids and for liquids is described. As an example, the results of measurements based on this method for nonoxidic and oxidic surfaces of copper are presented.

Paper Details

Date Published: 1 April 1995
PDF: 3 pages
Opt. Eng. 34(4) doi: 10.1117/12.197147
Published in: Optical Engineering Volume 34, Issue 4
Show Author Affiliations
Petro I. Drozd, Kiev Shevchenko Univ. (Ukraine)
Leonid V. Poperenko, Kiev Shevchenko Univ. (Ukraine)
Vasiliy V. Prorok, Shevchenko State Univ. (Ukraine)
Igor A. Shaykevich, Kiev Shevchenko Univ. (Ukraine)


© SPIE. Terms of Use
Back to Top