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Optical Engineering

Evaluation of curved crystals for cosmic x-ray spectroscopy
Author(s): Thomas H. Markert; Claude R. Canizares; Christie S. Nelson; James M. Bauer; Bernard Peter Puc; Bruce E. Woodgate
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Paper Abstract

We describe a spectrometer used to evaluate curved crystals, crystals originally intended for cosmic x-ray spectroscopy on the AXAF satellite. The most important feature of the AXAF instrument was the high-resolution spectra (λ/Δλ as high as 2000) that could be obtained from astronomical objects over the λ range 1.2 to 100 Å. The crystals are formed into narrow cylindrical facets and assembled into a pseudotoroidal surface. The spectral resolution is degraded by a number of effects, which we describe. The primary effect over which we have control is the figure of each cylindrical segment. We measure deviations from the nominal cylindrical shape, which we call Δθslope using a laboratory x-ray spectrometer. We present spectrometer data for several crystal samples, evaluated at different energies. We compare these results with similar tests performed at optical wavelengths. Our results indicate that the Δθslope error can be controlled, and that curved crystals with the desired resolving power can be fabricated.

Paper Details

Date Published: 1 May 1995
PDF: 12 pages
Opt. Eng. 34(5) doi: 10.1117/12.183992
Published in: Optical Engineering Volume 34, Issue 5
Show Author Affiliations
Thomas H. Markert, Massachusetts Institute of Technology (United States)
Claude R. Canizares, Massachusetts Institute of Technology (United States)
Christie S. Nelson, Massachusetts Institute of Technology (United States)
James M. Bauer, SUNY/Stony Brook (United States)
Bernard Peter Puc, Goddard Space Flight Center (United States)
Bruce E. Woodgate, NASA Goddard Space Flight Ctr. (United States)

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