Share Email Print

Optical Engineering

New moiré interferometry for measuring three-dimensional displacements
Author(s): Yinyan Wang; Fu-Pen Chiang
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new modified moiré interferometry for measuring u, v, and w displacement fields is proposed. The method is actually integrated with in-plane moiré interferometry and a new interferometry that can attain out-of-plane displacements. The sensitivity of the measurement of the out-of-plane displacement is as high as a half-wavelength of the illuminating light. The measured in-plane and out-of-plane displacement fields are mutually independent and definitely defined.

Paper Details

Date Published: 1 August 1994
PDF: 5 pages
Opt. Eng. 33(8) doi: 10.1117/12.177106
Published in: Optical Engineering Volume 33, Issue 8
Show Author Affiliations
Yinyan Wang, State Univ. of New York at Stony Brook (United States)
Fu-Pen Chiang, SUNY/Stony Brook (United States)

© SPIE. Terms of Use
Back to Top