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Optical Engineering

360-deg profilometry: new techniques for display and acquisition
Author(s): Anand Krishna Asundi; Chi-Shing Chan; Sajan R. Marokkey
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Paper Abstract

Two optical methods are proposed for shape measurement and defect detection of curved surfaces in the form of a complete 360-deg profile of the object. The first one is the standard structured light approach. Display of the resulting data is the emphasis of this section. The second approach uses modulated structured light with a scanning digital camera for faster and simpler data acquisition. Quantitative processing is done off-line while real-time moiré produces enhanced display of the defects for qualitative analysis.

Paper Details

Date Published: 1 August 1994
PDF: 10 pages
Opt. Eng. 33(8) doi: 10.1117/12.176507
Published in: Optical Engineering Volume 33, Issue 8
Show Author Affiliations
Anand Krishna Asundi, Univ. of Hong Kong (Hong Kong China)
Chi-Shing Chan, Univ. of Hong Kong (Hong Kong China)
Sajan R. Marokkey, Univ. of Hong Kong (Hong Kong China)


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