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Optical Engineering

Carrier pattern analysis of moiré interferometry using the Fourier transform moiré method
Author(s): Yoshiharu Morimoto; Harold E. Gascoigne; Daniel Post
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Paper Abstract

The Fourier transform moiré and grid method, which we previously presented, is extended to analyze strain distributions from the image of a fringe pattern with carrier fringes obtained by moiré interferometry. The characteristics of the carrier fringes and the procedure of obtaining strain distributions are explained in the spatial frequency domain. The fringe pattern without carrier fringes is obtained from the fringe pattern with carrier fringes by extracting the first harmonic of the spectrum of the fringe pattern with carrier fringes and shifting it. The strain distribution is obtained by analyzing the phase of the image obtained from the inverse Fourier transform of the shifted first harmonic. Strain distributions of a composite material with a wavy ply under compressive loading are analyzed.

Paper Details

Date Published: 1 August 1994
PDF: 8 pages
Opt. Eng. 33(8) doi: 10.1117/12.173578
Published in: Optical Engineering Volume 33, Issue 8
Show Author Affiliations
Yoshiharu Morimoto, Osaka Univ. (Japan)
Harold E. Gascoigne, California Polytechnic State Univ. (United States)
Daniel Post, Virginia Polytechnic Institute and State Univ. (United States)

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