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Optical Engineering

Analysis and removal of the systematic phase error in interferograms
Author(s): Qifeng Yu; Klaus Andresen; Wolfgang Osten; Werner P. O. Jueptner
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Paper Abstract

In an interferogram, the variation of intensity background and fringe amplitude displaces the fringe centerlines and gives rise to some systematic phase error if fringe tracking techniques are used. The behavior of this systematic phase error is analyzed in detail. This phase error oscillates from zero in the middle between bright and dark fringes to its extrema in both bright and dark fringe centerlines, but it is not accumulated over the whole image. A 2-D envelope transform with correct envelopes is proposed to remove the systematic phase error. To illustrate, some simulated fringe patterns are processed and analyzed.

Paper Details

Date Published: 1 May 1994
PDF: 8 pages
Opt. Eng. 33(5) doi: 10.1117/12.164606
Published in: Optical Engineering Volume 33, Issue 5
Show Author Affiliations
Qifeng Yu, Changsha Institute of Technology (China)
Klaus Andresen, Technical Univ. Braunschweig (Germany)
Wolfgang Osten, Bremen Institut fuer Angewandte Strahltechnik (Germany)
Werner P. O. Jueptner, Bremen Institut fuer Angewandte Strahltechnik (Germany)


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