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Journal of Electronic Imaging

Parallel mechanism for detecting contours in binary images
Author(s): Kuo-Chin Fan; Chin-Chuan Han
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Paper Abstract

We present a parallel mechanism for detecting contours embedded in a binary image. The proposed algorithm can detect contours in parallel in sequential machines with less computational effort. The hardware architecture of the algorithm is also proposed. Experiments with a wide variety of binary images show that the speed of this new technique is much faster than that of other contour detection methods.

Paper Details

Date Published: 1 January 1994
PDF: 7 pages
J. Electron. Imag. 3(1) doi: 10.1117/12.163971
Published in: Journal of Electronic Imaging Volume 3, Issue 1
Show Author Affiliations
Kuo-Chin Fan, National Central Univ. (Taiwan)
Chin-Chuan Han, National Central Univ. (Taiwan)

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