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Optical Engineering

Holographic interferometry using substrate guided waves
Author(s): Qiang Huang; John A. Gilbert; H. John Caulfield
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Paper Abstract

A new tool for experimental mechanics called substrate guided wave (SGW) holo-interferometry is described. The approach relies on recording and reconstructing time-average, double-exposure, and realtime holograms using light waves guided to the hologram by a dielectric sheet or substrate waveguide. The study illustrates that SGW holo-interlerometry can be used to isolate the reference wavefront from the environment surrounding the hologram and can be applied to measure the mechanical properties of the substrate itself. These attributes are discussed along with experimental work performed to develop and refine the technique.

Paper Details

Date Published: 1 April 1994
PDF: 6 pages
Opt. Eng. 33(4) doi: 10.1117/12.163188
Published in: Optical Engineering Volume 33, Issue 4
Show Author Affiliations
Qiang Huang, Univ. of Alabama in Huntsville (United States)
John A. Gilbert, Univ. of Alabama in Huntsville (United States)
H. John Caulfield, Alabama A&M Univ. (United States)


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