Optical EngineeringScanned-fringe, spatial-harmonic-distortion test for detector nonlinearity
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Results are presented for a modification of the spatial-harmonic-distortion test, suitable for nonlinearity measurement of single-element detectors, using a scanned-fringe technique and an electronic spectrum analyzer. Detector nonlinearity of less than 1% was measured at a wavelength of 10.6 μm. Previously, the smallest measured nonlinearity for the spatial-harmonic-distortion test was of the order of 3%, using a stationary-fringe technique and an 8-bit frame grabber.