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Optical Engineering

Scanned-fringe, spatial-harmonic-distortion test for detector nonlinearity
Author(s): Alberto J. Varela; Glenn D. Boreman
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Paper Abstract

Results are presented for a modification of the spatial-harmonic-distortion test, suitable for nonlinearity measurement of single-element detectors, using a scanned-fringe technique and an electronic spectrum analyzer. Detector nonlinearity of less than 1% was measured at a wavelength of 10.6 μm. Previously, the smallest measured nonlinearity for the spatial-harmonic-distortion test was of the order of 3%, using a stationary-fringe technique and an 8-bit frame grabber.

Paper Details

Date Published: 1 March 1994
PDF: 4 pages
Opt. Eng. 33(3) doi: 10.1117/12.159335
Published in: Optical Engineering Volume 33, Issue 3
Show Author Affiliations
Alberto J. Varela, Complutense Univ. of Madrid (United States)
Glenn D. Boreman, The Univ. of North Carolina at Charlotte (United States)

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