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Optical Engineering

Edge enhancement techniques for improving the performance of binary phase-only filter pattern recognition devices
Author(s): Jehad Khoury; Peter D. Gianino; Jonathan S. Kane; Charles L. Woods
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Paper Abstract

Several edge enhancement techniques are examined for improving the performance of binary phase-only filter pattern recognition devices. These include the linear techniques of blocking the lower Fourier orders and Laplacian filtering as well as the nonlinear techniques of phase extraction and phase binarization. The results indicate that the nonlinear techniques outperform the linear techniques when there is no distortion caused by aperturing the input information. However, when the input is apertured, both the linear and nonlinear techniques yield approximately the same peak-to-noise ratio.

Paper Details

Date Published: 1 March 1994
PDF: 9 pages
Opt. Eng. 33(3) doi: 10.1117/12.157663
Published in: Optical Engineering Volume 33, Issue 3
Show Author Affiliations
Jehad Khoury, Tufts Univ. (United States)
Peter D. Gianino, Rome Lab. (United States)
Jonathan S. Kane, U.S. Air Force (United States)
Charles L. Woods, Rome Lab. (United States)


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