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Optical Engineering

Interplanetary He II extreme-ultraviolet observation on PLANET-B
Author(s): Masato Nakamura; Tatsundo Yamamoto; Koichiro Tsuruda; Yoshifumi Saito; Koujun Yamashita; Akihiro Furuzawa; Toshihiro Ogawa; Supriya Chakrabarti
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Paper Abstract

Japan's spacecraft PLANET-B will be launched to Mars in 1998. An extreme-ultraviolet (EUV) measurement of 30.4-nm wavelength is proposed for an interplanetary He+ observation during the cruising phase from Earth to Mars. This measurement will help our understanding of the creation and loss of interplanetary He+. Another objective is to image the plasmasphere and magnetotail of the Earth. The EUV scanner we have designed for the PLANET-B mission will provide the opportunity to observe both interplanetary and magnetospheric He+. In addition, we describe another improved design of this EUV scanner, which covers wavelengths from 30 to 90 nm. This improved scanner will measure scattered light from helium (58.4 nm) and oxygen ions (83.4 nm) in addition to He II.

Paper Details

Date Published: 1 December 1993
PDF: 5 pages
Opt. Eng. 32(12) doi: 10.1117/12.155625
Published in: Optical Engineering Volume 32, Issue 12
Show Author Affiliations
Masato Nakamura, Institute of Space and Astronautical Science (Japan)
Tatsundo Yamamoto, Institute of Space & Astronautical Science (Japan)
Koichiro Tsuruda, Institute of Space and Astronautical Science (Japan)
Yoshifumi Saito, Institute of Space and Astronautical Science (Japan)
Koujun Yamashita, Nagoya Univ. (Japan)
Akihiro Furuzawa, Univ. of Nagoya (Japan)
Toshihiro Ogawa, Univ. of Tokyo (Japan)
Supriya Chakrabarti, Boston Univ. (United States)

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