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Optical Engineering

Infrared/microwave correlation measurements
Author(s): John D. Norgard
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Paper Abstract

An IR measurement technique that has been developed to measure electromagnetic (EM) fields is presented. This technique uses a minimally perturbing, thin, planar IR detection screen to produce a thermal map of the intensity of the EM energy over a two-dimensional region. Several examples of measured EM fields near radiating microwave sources and scattering bodies using IR thermograms are presented. These examples illustrate the use of this technique to correlate theoretical data with experimental observations and to experimentally validate complicated numerical codes that predict electric field distributions inside waveguide cavities (E fields) and surface current distributions on metallic surfaces (H fields).

Paper Details

Date Published: 1 January 1994
PDF: 12 pages
Opt. Eng. 33(1) doi: 10.1117/12.155377
Published in: Optical Engineering Volume 33, Issue 1
Show Author Affiliations
John D. Norgard, U.S. Air Force (United States)

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