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Optical Engineering

X-ray measurements of total reflectivity and scattering from Au-coated foils
Author(s): Allan Hornstrup; Finn Erland Christensen; Ellen Jespersen; U. Henriksen; Herbert W. Schnopper
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Paper Abstract

We present x-ray measurements of total reflectivity and scattering from gold-coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data shows a high reflectivity for all but the plastic foil, and only small microroughness (~15 Å at length scales below ~0.1 µm), evidenced by low resolution scattering measurements.

Paper Details

Date Published: 1 July 1990
PDF: 7 pages
Opt. Eng. 29(7) doi: 10.1117/12.153815
Published in: Optical Engineering Volume 29, Issue 7
Show Author Affiliations
Allan Hornstrup, Danish Space Research Institute (Denmark)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Ellen Jespersen, Danish Space Research Institute (Denmark)
U. Henriksen, Danish Space Research Institute (Denmark)
Herbert W. Schnopper, Danish Space Research Institute (Denmark)

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