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Optical Engineering • Open Access

Guest Editorial: X-Ray/EUV Optics
Author(s): Richard B. Hoover

Paper Abstract

The July special issue on x-ray/EUV optics begins with a consideration of the application of multilayer mirror technology to astronomy, microscopy, and spectroscopy. The Ultra-High Resolution XUV Spectroheliograph (a com¬plex array of multilayer x-ray telescopes that has been selected for flight on the U.S. space station Freedom) is described. This paper is followed by an overview of advances in multilayer x-ray/EUV optics by one of the pioneers of the field. Normal incidence multilayer x-ray mirrors have applications as optical components for Schwarzschild x-ray microscopes as well as telescopes.

Paper Details

Date Published: 1 July 1990
PDF: 1 pages
Opt. Eng. 29(7) doi: 10.1117/12.150799
Published in: Optical Engineering Volume 29, Issue 7
Show Author Affiliations
Richard B. Hoover, NASA (United States)


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