Optical Engineering • Open AccessGuest Editorial: X-Ray/EUV Optics
The July special issue on x-ray/EUV optics begins with a consideration of the application of multilayer mirror technology to astronomy, microscopy, and spectroscopy. The Ultra-High Resolution XUV Spectroheliograph (a com¬plex array of multilayer x-ray telescopes that has been selected for flight on the U.S. space station Freedom) is described. This paper is followed by an overview of advances in multilayer x-ray/EUV optics by one of the pioneers of the field. Normal incidence multilayer x-ray mirrors have applications as optical components for Schwarzschild x-ray microscopes as well as telescopes.