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Optical Engineering

Low-absorption measurements of optical thin films at 10.6 microns
Author(s): Jean DiJon; Erik Duloisy; Philippe Lyan
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Paper Abstract

We present new data analysis of photothermal measurements to extract the extinction coefficient k of thin films or bare substrates at 10.6 μm. We show how to obtain k by means of analytical formulation, with substrate absorption taken into account, and how to minimize experimental errors. Then, we discuss accuracy and reliability for substrates, thin films, and mirrors. Results are given for k values as low as 10-4 for thin films and 10-8 for substrates. Mirror reflectivities higher than 99.8% were measured

Paper Details

Date Published: 1 November 1993
PDF: 6 pages
Opt. Eng. 32(11) doi: 10.1117/12.147717
Published in: Optical Engineering Volume 32, Issue 11
Show Author Affiliations
Jean DiJon, CEN/G (France)
Erik Duloisy, CEN/G (France)
Philippe Lyan, CEN/G (France)

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