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Optical Engineering

Order-sorting filter transmittance measured with an array detector
Author(s): James B. Heaney; Scott E. Bradley; Vincent T. Bly; Audrey J. Ewin; Anh T. La
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Paper Abstract

The simultaneous measurement of the spectrally and spatially variant transmittance of a linear variable order-sorting filter in a manner that closely resembles its conditions of actual use is described. The transmittance of a prototype order-sorting filter was measured in the 400- to 880-nm wavelength region by illuminating it with the output beam of a spectrophotometer while the filter was attached to the front of a 30 x 32 pixel silicon array detector. The filter was designed to be used in the output beam of a grating spectrometer to prevent the dispersal of higher diffracted orders onto an array detector. Areas of the filter that were spatially matched to the corresponding detector pixel column had measured peak transmittances of about 90% that were uniform to within ±1.5% along a given column. Transmittances for incident wavelengths shorter than the desired bandpass, corresponding to the order overlap region, were measured in the 3 x 10-3 range. Line spread function measurements made with the array detector indicated no significant beam spreading caused by inserting the filter into the beam.

Paper Details

Date Published: 1 August 1993
PDF: 8 pages
Opt. Eng. 32(8) doi: 10.1117/12.143302
Published in: Optical Engineering Volume 32, Issue 8
Show Author Affiliations
James B. Heaney, NASA (United States)
Scott E. Bradley, Fairchild Space Co. (United States)
Vincent T. Bly, NASA (United States)
Audrey J. Ewin, NASA (United States)
Anh T. La, NASA (United States)


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