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Optical Engineering

Additive/subtractive decorrelated electronic speckle pattern interferometry
Author(s): Bruno F. Pouet; Sridhar Krishnaswamy
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Paper Abstract

A hybrid additive-subtractive decorrelated electronic speckle pattern interferometry (ESPI) scheme using a continuous reference updating technique is presented. Unlike conventional ESPI techniques, this method uses speckle phase decorrelation between successively subtracted additive correlated speckle images, each of which contains information about the same two states of deformation of a test object undergoing vibrational stressing. It is shown that the susceptibility of this method to environmental noise caused by building vibrations or air currents is significantly lower than that of conventional subtractive ESPI methods, and fringe visibility and contrast are significantly improved over conventional additive ESPI techniques. The ability of this technique to work in a turbulent environment is demonstrated, and application to detection of defects in adhesively bonded structures, a problem of interest to the nondestructive evaluation (NDE) community, is shown.

Paper Details

Date Published: 1 June 1993
PDF: 10 pages
Opt. Eng. 32(6) doi: 10.1117/12.135841
Published in: Optical Engineering Volume 32, Issue 6
Show Author Affiliations
Bruno F. Pouet, Northwestern Univ. (United States)
Sridhar Krishnaswamy, Northwestern Univ. (United States)


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