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Optical Engineering

Testing aspheric surfaces using multiple annular interferograms
Author(s): Mauro Melozzi; Luis Pezzati; Alessandro Mazzoni
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Paper Abstract

We present a technique for interferometrically testing aspheric surfaces without the use of compensating elements. The method consists of recording successive overlapping phase maps from a set of annular interferograms of an aspheric surface, obtained using a conventional phase-shifting interferometer and a micropositioning translator stage. These maps are then sewn together with a suitable algorithm we developed, and the whole surface error is recovered. Experimental results are shown to be in good agreement with the null lens test performed for comparison.

Paper Details

Date Published: 1 May 1993
PDF: 7 pages
Opt. Eng. 32(5) doi: 10.1117/12.133344
Published in: Optical Engineering Volume 32, Issue 5
Show Author Affiliations
Mauro Melozzi, Officine Galileo SpA (Italy)
Luis Pezzati, Officine Galileo SpA (Italy)
Alessandro Mazzoni, Officine Galileo (Italy)

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