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Optical Engineering

Surface topography measurement of plasma-facing materials by dual-wavelength phase-shifting speckle interferometry technique
Author(s): Xiaoqian Cui; Hongbei Wang; Mengge Zhao; Yuanbo Li; Hongbin Ding
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Paper Abstract

A dual-wavelength phase-shifting speckle interferometry approach has been proposed to diagnose the topography of plasma-facing materials (PFMs) in tokamak. The conventional speckle interferometric surface measurement, which uses single-wavelength, can offer excellent vertical resolution, but limitation in measuring large height step and phase ambiguity would occur during their application. To solve the problem, a dual-wavelength method was developed. Experiments were conducted on molybdenum (Mo) sample, which is related to PFMs of experimental advanced superconducting tokamak (EAST), and a laser ablation method was adopted to simulate the erosion happed on PFMs. The laser ablation craters were measured by both single-wavelength and dual-wavelength phase-shifting speckle interferometry, and a multistep phase-shifting method has been investigated for their effectiveness on reducing noise in calculating the phase map. This work demonstrates the superiority of the dual-wavelength speckle interferometry and the feasibility of applying the measurement system in topographic measurement of PFMs in EAST.

Paper Details

Date Published: 27 January 2018
PDF: 9 pages
Opt. Eng. 57(1) 014109 doi: 10.1117/1.OE.57.1.014109
Published in: Optical Engineering Volume 57, Issue 1
Show Author Affiliations
Xiaoqian Cui, Dalian Univ. of Technology (China)
Hongbei Wang, Dalian Univ. of Technology (China)
Mengge Zhao, Dalian Univ. of Technology (China)
Yuanbo Li, Dalian Univ. of Technology (China)
Hongbin Ding, Dalian Univ. of Technology (China)


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