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Optical Engineering • Open Access

Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide
Author(s): David C. Look; Kevin D. Leedy; Arnold Kiefer; Bruce B. Claflin; Naho Itagaki; Koichi Matsushima; Iping Suhariadi

Paper Abstract

This PDF file contains the errata for “OE Vol. 56 Issue 04 Paper OE-2017-0322-ERR” for OE Vol. 56 Issue 04

Paper Details

Date Published: 4 April 2017
PDF: 1 pages
Opt. Eng. 56(4) 049801 doi: 10.1117/1.OE.56.4.049801
Published in: Optical Engineering Volume 56, Issue 4
Show Author Affiliations
David C. Look, Wright State Univ. (United States)
Wyle Labs. (United States)
Air Force Research Lab. (United States)
Kevin D. Leedy, Air Force Research Lab. (United States)
Arnold Kiefer, Air Force Research Lab. (United States)
Bruce B. Claflin, Air Force Research Lab. (United States)
Naho Itagaki, Kyushu Univ. (Japan)
Koichi Matsushima, Kyushu Univ. (Japan)
Iping Suhariadi, Kyushu Univ. (Japan)


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