Share Email Print
cover

Optical Engineering

Discussion on accurate phase–height mapping in fringe projection profilometry
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Establishing a highly accurate phase-to-height mapping relationship is very important in fringe projection profilometry, which guarantees the accuracy of final three-dimensional reconstruction. The influence coming from lens distortion, random noises, and the nontelecentric projecting and imaging of the measurement system is analyzed in detail, followed by the exhaustive discussion of a more accurate phase-to-height mapping method. The mapping tabulation between absolute phase and height information is set up by the piecewise linear fitting method within the whole measurement range for per-pixel. Our method is compared with the previously used methods, such as linear fitting (LF), quadratic fitting (QF), and cubic fitting (CF) methods. Computer simulations and experiments verify that the reconstructed height distribution employing our method is more accurate than either LF or QF methods when the random noise is obvious. In addition, if the random noise can be controlled to low level and the lens distortion is considered, the reconstruction accuracy of our method is better than that of the CF method.

Paper Details

Date Published: 26 October 2017
PDF: 11 pages
Opt. Eng. 56(10) 104109 doi: 10.1117/1.OE.56.10.104109
Published in: Optical Engineering Volume 56, Issue 10
Show Author Affiliations
Wenjing Zhao, Sichuan Univ. (China)
Xianyu Su, Sichuan Univ. (China)
Wenjing Chen, Sichuan Univ. (China)


© SPIE. Terms of Use
Back to Top