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Optical Engineering • Open Access

Analysis of laser damage tests on coatings designed for broad bandwidth high reflection of femtosecond pulses
Author(s): John Bellum; Trevor Winstone; Laurent Lamaignere; Martin Sozet; Mark Kimmel; Patrick Rambo; Ella Field; Damon Kletecka

Paper Abstract

We designed an optical coating based on TiO2/SiO2 layer pairs for broad bandwidth high reflection (BBHR) at 45-deg angle of incidence (AOI), P polarization of femtosecond (fs) laser pulses of 900-nm center wavelength, and produced the coatings in Sandia’s large optics coater by reactive, ion-assisted e-beam evaporation. This paper reports on laser-induced damage threshold (LIDT) tests of these coatings. The broad HR bands of BBHR coatings pose challenges to LIDT tests. An ideal test would be in a vacuum environment appropriate to a high energy, fs-pulse, petawatt-class laser, with pulses identical to its fs pulses. Short of this would be tests over portions of the HR band using nanosecond or sub-picosecond pulses produced by tunable lasers. Such tests could, e.g., sample 10-nm-wide wavelength intervals with center wavelengths tunable over the broad HR band. Alternatively, the coating’s HR band could be adjusted by means of wavelength shifts due to changing the AOI of the LIDT tests or due to the coating absorbing moisture under ambient conditions. We had LIDT tests performed on the BBHR coatings at selected AOIs to gain insight into their laser damage properties and analyze how the results of the different LIDT tests compare.

Paper Details

Date Published: 25 August 2016
PDF: 13 pages
Opt. Eng. 56(1) 011012 doi: 10.1117/1.OE.56.1.011012
Published in: Optical Engineering Volume 56, Issue 1
Show Author Affiliations
John Bellum, Sandia National Labs. (United States)
Trevor Winstone, STFC Rutherford Appleton Lab. (United Kingdom)
Laurent Lamaignere, Commissariat à l’Energie Atomique et aux Energies Alternatives (France)
Martin Sozet, Commissariat à l’Energie Atomique et aux Energies Alternatives (France)
Mark Kimmel, Sandia National Labs. (United States)
Patrick Rambo, Sandia National Labs. (United States)
Ella Field, Sandia National Labs. (United States)
Damon Kletecka, Sandia National Labs. (United States)


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