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Optical Engineering • Open Access

Laser-induced damage of intrinsic and extrinsic defects by picosecond pulses on multilayer dielectric coatings for petawatt-class lasers
Author(s): Raluca A. Negres; Christopher W. Carr; Ted A. Laurence; Ken Stanion; Gabe Guss; David A. Cross; Paul J. Wegner; Christopher J. Stolz

Paper Abstract

We describe a damage testing system and its use in investigating laser-induced optical damage initiated by both intrinsic and extrinsic precursors on multilayer dielectric coatings suitable for use in high-energy, large-aperture petawatt-class lasers. We employ small-area damage test methodologies to evaluate the intrinsic damage resistance of various coatings as a function of deposition methods and coating materials under simulated use conditions. In addition, we demonstrate that damage initiation by raster scanning at lower fluences and growth threshold testing are required to probe the density of extrinsic defects, which will limit large-aperture optics performance.

Paper Details

Date Published: 1 August 2016
PDF: 9 pages
Opt. Eng. 56(1) 011008 doi: 10.1117/1.OE.56.1.011008
Published in: Optical Engineering Volume 56, Issue 1
Show Author Affiliations
Raluca A. Negres, Lawrence Livermore National Laboratory (United States)
Christopher W. Carr, Lawrence Livermore National Laboratory (United States)
Ted A. Laurence, Lawrence Livermore National Laboratory (United States)
Ken Stanion, Lawrence Livermore National Laboratory (United States)
Gabe Guss, Lawrence Livermore National Laboratory (United States)
David A. Cross, Lawrence Livermore National Laboratory (United States)
Paul J. Wegner, Lawrence Livermore National Laboratory (United States)
Christopher J. Stolz, Lawrence Livermore National Laboratory (United States)


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