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Optical Engineering

Effects of heavy ion radiation on digital micromirror device performance
Author(s): Anton Travinsky; Dmitry Vorobiev; Zoran Ninkov; Alan D. Raisanen; Jonny Pellish; Massimo Robberto; Sara Heap
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Paper Abstract

There is a pressing need in the astronomical community for space-suitable multiobject spectrometers (MOSs). Several digital micromirror device (DMD)-based prototype MOSs have been developed for ground-based observatories; however, their main use will come with deployment on a space-based mission. Therefore, the performance of DMDs under exoatmospheric radiation needs to be evaluated. DMDs were rewindowed with 2-μm thick pellicle and tested under accelerated heavy-ion radiation (control electronics shielded from radiation), with a focus on the detection of single-event effects (SEEs) including latch-up events. Testing showed that while DMDs are sensitive to nondestructive ion-induced state changes, all SEEs are cleared with a soft reset (i.e., sending a pattern to the device). The DMDs did not experience single-event induced permanent damage or functional changes that required a hard reset (power cycle), even at high ion fluences. This suggests that the SSE rate burden will be manageable for a DMD-based instrument when exposed to solar particle fluxes and cosmic rays in orbit.

Paper Details

Date Published: 29 September 2016
PDF: 8 pages
Opt. Eng. 55(9) 094107 doi: 10.1117/1.OE.55.9.094107
Published in: Optical Engineering Volume 55, Issue 9
Show Author Affiliations
Anton Travinsky, Rochester Institute of Technology (United States)
Dmitry Vorobiev, Rochester Institute of Technology (United States)
Zoran Ninkov, Rochester Institute of Technology (United States)
Alan D. Raisanen, Rochester Institute of Technology (United States)
Jonny Pellish, NASA Goddard Space Flight Ctr. (United States)
Massimo Robberto, Space Telescope Science Institute (United States)
Sara Heap, NASA Goddard Space Flight Ctr. (United States)


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