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Measurement of strain distribution in cortical bone around miniscrew implants used for orthodontic anchorage using digital speckle pattern interferometry
Author(s): Manoj Kumar; Rupali Agarwal; Ravi Bhutani; Chandra Shakher
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Paper Abstract

An application of digital speckle pattern interferometry (DSPI) for the measurement of deformations and strain-field distributions developed in cortical bone around orthodontic miniscrew implants inserted into the human maxilla is presented. The purpose of this study is to measure and compare the strain distribution in cortical bone/miniscrew interface of human maxilla around miniscrew implants of different diameters, different implant lengths, and implants of different commercially available companies. The technique is also used to measure tilt/rotation of canine caused due to the application of retraction springs. The proposed technique has high sensitivity and enables the observation of deformation/strain distribution. In DSPI, two specklegrams are recorded corresponding to pre- and postloading of the retraction spring. The DSPI fringe pattern is observed by subtracting these two specklegrams. Optical phase was extracted using Riesz transform and the monogenic signal from a single DSPI fringe pattern. The obtained phase is used to calculate the parameters of interest such as displacement/deformation and strain/stress. The experiment was conducted on a dry human skull fulfilling the criteria of intact dental arches and all teeth present. Eight different miniscrew implants were loaded with an insertion angulation of 45 deg in the inter-radicular region of the maxillary second premolar and molar region. The loading of miniscrew implants was done with force level (150 gf) by nickel–titanium closed-coil springs (9 mm). The obtained results from DSPI reveal that implant diameter and implant length affect the displacement and strain distribution in cortical bone layer surrounding the miniscrew implant.

Paper Details

Date Published: 5 May 2016
PDF: 12 pages
Opt. Eng. 55(5) 054101 doi: 10.1117/1.OE.55.5.054101
Published in: Optical Engineering Volume 55, Issue 5
Show Author Affiliations
Manoj Kumar, Indian Institute of Technology Delhi (India)
Rupali Agarwal, Sharda Univ. (India)
Ravi Bhutani, Sharda Univ. (India)
Chandra Shakher, Indian Institute of Technology Delhi (India)

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