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Optical Engineering

Optical waveguides fabricated by nitrogen ion implantation in fused silica
Author(s): Chun-Xiao Liu; Li-Li Fu; Rui-Lin Zheng; Hai-Tao Guo; Zhi-Guang Zhou; Wei-Nan Li; She-Bao Lin; Wei Wei
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Paper Abstract

We report on the fabrication of waveguides in fused silica using 4.5-MeV nitrogen ion implantation with a fluence of 5.0×1014  ions/cm2. The prism-coupling method was employed to measure the effective refractive indices of guiding modes at the wavelengths of 632.8 and 1539 nm. The effective refractive indices of the first few modes were higher than that of the substrate. The refractive index profiles at 632.8 and 1539 nm were reconstructed by the reflectivity calculation method. Positive index changes were induced in the waveguide layers. The end-face coupling method was used to measure the near-field light intensity distributions at the wavelength of 632.8 nm and the finite-difference beam propagation method was applied to simulate the guided mode profile at the wavelength of 1539 nm. The waveguide structures emerge as candidates for integrated photonic devices.

Paper Details

Date Published: 18 February 2016
PDF: 5 pages
Opt. Eng. 55(2) 027105 doi: 10.1117/1.OE.55.2.027105
Published in: Optical Engineering Volume 55, Issue 2
Show Author Affiliations
Chun-Xiao Liu, Nanjing Univ. of Posts and Telecommunications (China)
Li-Li Fu, Nanjing Univ. of Posts and Telecommunications (China)
Rui-Lin Zheng, Nanjing Univ. of Posts and Telecommunications (China)
Hai-Tao Guo, Xi'an Institute of Optics and Precision Mechanics (China)
Zhi-Guang Zhou, Xi'an Institute of Optics and Precision Mechanics (China)
Wei-Nan Li, Xi'an Institute of Optics and Precision Mechanics (China)
She-Bao Lin, Baoji Univ. of Arts and Science (China)
Wei Wei, Nanjing Univ. of Posts and Telecommunications (China)


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