Share Email Print

Optical Engineering

Effective thermal expansion coefficient measurement of holographic material using total internal reflection heterodyne interferometry
Author(s): Ching-Tang Meng; Chih-Ching Cheng; Cheng-Chih Hsu; Chyan-Chyi Wu
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The thermal optical properties of a holographic material were measured using total internal reflection heterodyne interferometry. The effective thermal expansion coefficients (ETECs) of the holographic material were determined at various exposure times. Our results showed that the holographic material exhibited a smaller thermal expansion coefficient (TEC) with a longer exposure time than those materials with short exposure times. Thus the diffraction power increased as the exposure time of the holographic material increased. Furthermore, the proposed method provides a highly accurate means of measurement for determination of the TEC. The theoretical ETEC error of the proposed method is better than 1.1×10−7 and the practical ETEC error under the precision measurement conditions can reach to 2.3×10−6.

Paper Details

Date Published: 22 September 2015
PDF: 5 pages
Opt. Eng. 54(9) 094105 doi: 10.1117/1.OE.54.9.094105
Published in: Optical Engineering Volume 54, Issue 9
Show Author Affiliations
Ching-Tang Meng, Yuan Ze Univ. (Taiwan)
Chih-Ching Cheng, Yuan Ze Univ. (Taiwan)
Cheng-Chih Hsu, Yuan Ze Univ. (Taiwan)
Chyan-Chyi Wu, Tamkang Univ. (Taiwan)

© SPIE. Terms of Use
Back to Top