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Optical Engineering • Open Access

Alternative phase-shifting technique for measuring full-field refractive index
Author(s): Kun-Huang Chen; Jing-Heng Chen; Jiun-You Lin; Yen-Chang Chu

Paper Abstract

This study proposes an alternative and simple method for measuring full-field refractive index. This method is based on the phase-shifting technique with a modulated electro-optical (EO) modulator and the phenomenon of total internal reflection. To this purpose, a linear polarized light is expanded and incident on the interface between the prism and the tested specimen, and the reflected light passes through an analyzer for interference. The phase difference between the s- and p-polarized light is sensitive to the refractive index of the tested specimen when the total internal reflection appears on this interface. Based on this effect, the resulting phase differences make it possible to analyze the refractive index of the tested specimen through a phase-shifting technique with a modulated EO modulator. The feasibility of this method was verified by experiment, and the measurement resolution can reach a value of refractive index unit of at least 3.552×10−4. This method has advantages of simple installation, ease of operation, and fast measurement.

Paper Details

Date Published: 10 September 2015
PDF: 5 pages
Opt. Eng. 54(9) 094101 doi: 10.1117/1.OE.54.9.094101
Published in: Optical Engineering Volume 54, Issue 9
Show Author Affiliations
Kun-Huang Chen, Feng Chia Univ. (Taiwan)
Jing-Heng Chen, Feng Chia Univ. (Taiwan)
Jiun-You Lin, National Changhua Univ. of Education (Taiwan)
Yen-Chang Chu, Feng Chia Univ. (Taiwan)

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