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Optical Engineering

Decoding line structured light patterns by using Fourier analysis
Author(s): Yunfei Long; Shuaijun Wang; Wei Wu; Xiaomin Yang; Gwanggil Jeon; Kai Liu
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Paper Abstract

Line structured light techniques, especially laser scanning, are preferred for commercialized three-dimensional (3-D) shape acquisition. Typically, a captured line stripe is to be detected spatially within a single image, and the detection may fail if there are ambiguities in the image. We present a decoding strategy for line structured light patterns. Over all recorded line-patterned images, by means of Fourier analysis along the time axis for each pixel, a phase map is computed and employed for 3-D reconstruction. The phase error is theoretically analyzed. Experimental results demonstrate that, compared with typical approaches based on spatial stripe peak detection, the proposed method achieves comparable accuracy and, most importantly, successfully handles the issue of ambiguities.

Paper Details

Date Published: 23 July 2015
PDF: 6 pages
Opt. Eng. 54(7) 073109 doi: 10.1117/1.OE.54.7.073109
Published in: Optical Engineering Volume 54, Issue 7
Show Author Affiliations
Yunfei Long, Sichuan Univ. (China)
Shuaijun Wang, Sichuan Univ. (China)
Wei Wu, Sichuan Univ. (China)
Xiaomin Yang, Sichuan Univ. (China)
Gwanggil Jeon, Incheon National Univ. (Republic of Korea)
Kai Liu, Sichuan Univ. (China)

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