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Optical Engineering • Open Access

Improving the accuracy of phase-shifting techniques
Author(s): William Cruz-Santos; Lourdes López-García; Arturo Redondo-Galvan

Paper Abstract

The traditional phase-shifting profilometry technique is based on the projection of digital interference patterns and computation of the absolute phase map. Recently, a method was proposed that used phase interpolation to the corner detection, at subpixel accuracy in the projector image for improving the camera–projector calibration. We propose a general strategy to improve the accuracy in the search for correspondence that can be used to obtain high precision three-dimensional reconstruction. Experimental results show that our strategy can outperform the precision of the phase-shifting method.

Paper Details

Date Published: 13 May 2015
PDF: 3 pages
Opt. Eng. 54(5) 054102 doi: 10.1117/1.OE.54.5.054102
Published in: Optical Engineering Volume 54, Issue 5
Show Author Affiliations
William Cruz-Santos, Univ. Autónoma del Estado de México (Mexico)
Lourdes López-García, CU-UAEM Valle de Chalco (Mexico)
Arturo Redondo-Galvan, Univ. Autónoma del Estado de México (Mexico)

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