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Optical Engineering

Efficiently approximate method for near field uniformity evaluation of finite-sized multilayered dielectric plates
Author(s): Yi Tian; Hui Yan; Xin Wang; Li Zhang; Zhuo Li
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Paper Abstract

A method for joint transmission line and aperture field integration (TL-AFIM) is proposed and utilized to efficiently compute the near-field distribution of the finite-sized multilayered dielectric plates. Four indicators Epv, Erms, φpv, and φrms representing the amplitude and phase variations are proposed to evaluate the near-field uniformity. A multilayered dielectric plate containing three dielectric layers is analyzed and evaluated by TL-AFIM. Compared to the commonly used multilevel fast multipole method (MLFMM), the memory requirement and CPU time consumption are drastically reduced from 61.3 GB and 20.2 h to 4.4 MB and 2.5 s, respectively. The calculation accuracy is better than 90%.

Paper Details

Date Published: 12 February 2015
PDF: 5 pages
Opt. Eng. 54(2) 025109 doi: 10.1117/1.OE.54.2.025109
Published in: Optical Engineering Volume 54, Issue 2
Show Author Affiliations
Yi Tian, Beijing Institute of Technology (China)
Shanghai Institute of Electro-mechanical Engineering (China)
Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology (China)
Hui Yan, Beijing Institute of Technology (China)
Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology (China)
Xin Wang, Beijing Institute of Technology (China)
Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology (China)
Li Zhang, Shanghai Institute of Electro-mechanical Engineering (China)
Zhuo Li, Beijing Institute of Technology (China)
Beijing Key Lab. for Precision Optoelectronic Measurement Instrument and Technology (China)


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