Share Email Print
cover

Optical Engineering

Intensity-based method for selection of valid interferometric data in temporal phase shifting interferometry
Author(s): Jaime Sánchez-Paredes; Gilberto Silva-Ortigoza; Jorge Castro-Ramos
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

In this paper, we propose a method to detect the valid phase pixels of fringe patterns obtained with phase shifting interferometry. From a set of simulated interferogram images, we obtain a set of equations to discriminate between valid and invalid wavefront phase pixels, which allow us to compute the wavefront aberration. This method is useful for testing any converging optical system in a quantitative way with either a small or large focal ratio, with either polished or rough surfaces and with wavefront or lateral shear interferograms.

Paper Details

Date Published: 18 February 2015
PDF: 8 pages
Opt. Eng. 54(2) 024106 doi: 10.1117/1.OE.54.2.024106
Published in: Optical Engineering Volume 54, Issue 2
Show Author Affiliations
Jaime Sánchez-Paredes, Instituto Nacional de Astrofísica Óptica y Electrónica (México)
Gilberto Silva-Ortigoza, Benemérita Univ. Autónoma de Puebla (Mexico)
CINVESTAV-IPN (Mexico)
Jorge Castro-Ramos, Instituto Nacional de Astrofísica, Óptica y Electrónica (México)


© SPIE. Terms of Use
Back to Top