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Optical Engineering

High-resolution optical refractometer based on a long-period grating Michelson interferometer using a cross-correlation signal-processing method
Author(s): Xinlei Zhou; Ke Chen; Xuefeng Mao; Wei Peng; Qingxu Yu
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Paper Abstract

We report a high-resolution optical refractometer based on the long-period grating Michelson interferometer. The interferometer phase shift depends on the refractive index that surrounds the fiber probe. A cross-correlation signal-processing method is used to demodulate the interferometer phase shift. Experimental results show that a resolution of 3×10−6   refractive  index  unit (RIU) can be obtained using this cross-correlation signal processing method. In addition, a measurement sensitivity up to 3×103  deg/RIU is showed as the surrounding refractive index changing from 1.33 to 1.42. Such high-resolution and low-cost optical refractometers would find more applications in chemical or biochemical sensing fields.

Paper Details

Date Published: 17 December 2015
PDF: 6 pages
Opt. Eng. 54(12) 126108 doi: 10.1117/1.OE.54.12.126108
Published in: Optical Engineering Volume 54, Issue 12
Show Author Affiliations
Xinlei Zhou, Dalian Univ. of Technology (China)
Ke Chen, Dalian Univ. of Technology (China)
Xuefeng Mao, Dalian Univ. of Technology (China)
Wei Peng, Dalian Univ. of Technology (China)
Qingxu Yu, Dalian Univ. of Technology (China)

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