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Optical Engineering

Influence of outgassing organic contamination on the transmittance and laser‐induced damage of SiO2 sol‐gel antireflection film
Author(s): Liang Yang; Xia Xiang; Xinxiang Miao; Zhijie Li; Guorui Zhou; Zhonghua Yan; Xiaodong Yuan; Wanguo Zheng; Xiaotao Zu
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Paper Abstract

The influence of organic contamination (rubber outgassing) on the transmittance of the SiO2 sol‐gel antireflection (AR) film and laser‐induced damage threshold (LIDT) at 355 nm for 3ω AR film and at 1064 nm for 1ω AR film is studied. The correlation between the contamination time and the transmittance loss/LIDT of 1ω/3ω AR film is also investigated both in atmospheric and vacuum environments. The results show that the transmittance loss increases with increasing contamination time, and the LIDT decreases with increasing contamination time for both in atmospheric and vacuum environments. In addition, the resistance against contamination of the 1ω film is stronger than 3ω film, and the contamination is more serious in vacuum than in an atmosphere environment for the same contamination time. Meanwhile, the damage mechanism is also discussed. It indicated that both the porous structure and photo‐thermal absorption contribute to the decreasing LIDT of the sol‐gel AR film.

Paper Details

Date Published: 8 December 2015
PDF: 6 pages
Opt. Eng. 54(12) 126101 doi: 10.1117/1.OE.54.12.126101
Published in: Optical Engineering Volume 54, Issue 12
Show Author Affiliations
Liang Yang, Univ. of Electronic Science and Technology of China (China)
China Academy of Engineering Physics (China)
Xia Xiang, Univ. of Electronic Science and Technology of China (China)
Xinxiang Miao, China Academy of Engineering Physics (China)
Zhijie Li, Univ. of Electronic Science and Technology of China (China)
Guorui Zhou, China Academy of Engineering Physics (China)
Zhonghua Yan, Univ. of Electronic Science and Technology of China (China)
Xiaodong Yuan, China Academy of Engineering Physics (China)
Wanguo Zheng, China Academy of Engineering Physics (China)
Xiaotao Zu, Univ. of Electronic Science and Technology of China (China)


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