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Optical Engineering

Application of low-coherence interferometry for <italic<in situ</italic< nondestructive evaluation of thin and thick multilayered transparent composites
Author(s): Anton Khomenko; Gary Lee Cloud; Mahmoodul Haq
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Paper Abstract

Multilayered transparent composites having laminates with polymer interlayers and backing sheets are commonly used in a wide range of applications where visibility, transparency, impact resistance, and safety are essential. Manufacturing flaws or damage during operation can seriously compromise both safety and performance. Most fabrication defects are not discernible until after the entire multilayered transparent composite assembly has been completed, and in-the-field inspection for damage is a problem not yet solved. A robust and reliable nondestructive evaluation (NDE) technique is needed to evaluate structural integrity and identify defects that result from manufacturing issues as well as in-service damage arising from extreme environmental conditions in addition to normal mechanical and thermal loads. Current optical techniques have limited applicability for NDE of such structures. This work presents a technique that employs a modified interferometer utilizing a laser diode or femtosecond fiber laser source to acquire <italic<in situ</italic< defect depth location inside a thin or thick multilayered transparent composite, respectively. The technique successfully located various defects inside examined composites. The results show great potential of the technique for defect detection, location, and identification in multilayered transparent composites.

Paper Details

Date Published: 16 December 2015
PDF: 9 pages
Opt. Eng. 54(12) 125103 doi: 10.1117/1.OE.54.12.125103
Published in: Optical Engineering Volume 54, Issue 12
Show Author Affiliations
Anton Khomenko, Michigan State Univ. (United States)
Gary Lee Cloud, Michigan State Univ. (United States)
Mahmoodul Haq, Michigan State Univ. (United States)


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