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Optical Engineering

Raman spectroscopic detection using a two-dimensional spatial heterodyne spectrometer
Author(s): Guangxiao Hu; Wei Xiong; Hailiang Shi; Zhiwei Li; Jing Shen; Xuejing Fang
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Paper Abstract

Spatial heterodyne Raman spectroscopy (SHRS) is a type of method for the detection of Raman spectra and can achieve a very high spectral resolution. SHRS has no moving parts and can be built with rugged, compact packages, making it extremely suitable for planetary exploration. However, if a high spectral resolution is needed, a traditional one-dimensional spatial heterodyne spectrometer cannot achieve a broad bandpass because it is limited by the number of pixels of the detector. In order to solve this, two-dimensional (2-D) SHRS can be used to broaden the bandpass. A breadboard of 2-D SHRS has been designed and built, and some artificial and natural targets have been tested to learn about the detection ability of 2-D SHRS. The results show that 2-D SHRS can be used to detect Raman signals scattered from liquid and solid targets. When the Raman scattered signal is strong, it can even detect targets in containers. The detection of anti-Stokes Raman shift for sulfur and carbon tetrachloride has also been tried, and the results show that 2-D SHRS has the ability to detect anti-Stokes Raman shift below 500  cm−1. The research may have a general implication in chemical analysis and planetary exploration.

Paper Details

Date Published: 3 November 2015
PDF: 9 pages
Opt. Eng. 54(11) 114101 doi: 10.1117/1.OE.54.11.114101
Published in: Optical Engineering Volume 54, Issue 11
Show Author Affiliations
Guangxiao Hu, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Key Lab. of Optical Calibration and Characterization (China)
Wei Xiong, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Hailiang Shi, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Zhiwei Li, Anhui Institute of Optics and Fine Mechanics (China)
Key Lab. of Optical Calibration and Characterization (China)
Jing Shen, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Key Lab. of Optical Calibration and Characterization (China)
Xuejing Fang, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Key Lab. of Optical Calibration and Characterization (China)


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