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Optical Engineering • Open Access

Metrology of single-photon sources and detectors: a review

Paper Abstract

The generation, measurement, and manipulation of light at the single- and few-photon levels underpin a rapidly expanding range of applications. These range from applications moving into the few-photon regime in order to achieve improved sensitivity and/or energy efficiency, as well as new applications that operate solely in this regime, such as quantum key distribution and physical quantum random number generation. There is intensive research to develop new quantum optical technologies, for example, quantum sensing, simulation, and computing. These applications rely on the performance of the single-photon sources and detectors they employ; this review article gives an overview of the methods, both conventional and recently developed, that are available for measuring the performance of these devices, with traceability to the SI system.

Paper Details

Date Published: 10 July 2014
PDF: 17 pages
Opt. Eng. 53(8) 081910 doi: 10.1117/1.OE.53.8.081910
Published in: Optical Engineering Volume 53, Issue 8
Show Author Affiliations
Christopher J. Chunnilall, National Physical Lab. (United Kingdom)
Ivo Pietro Degiovanni, Istituto Nazionale di Ricerca Metrologica (Italy)
Stefan Kück, Physikalisch-Technische Bundesanstalt (Germany)
Ingmar Müller, Physikalisch-Technische Bundesanstalt (Germany)
Alastair G. Sinclair, National Physical Lab. (United Kingdom)

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