Share Email Print
cover

Optical Engineering • Open Access

Optimization of parameters for bonnet polishing based on the minimum residual error method
Author(s): Chunjin Wang; Wei Yang; Shiwei Ye; Zhenzhong Wang; Bo Zhong; Yinbiao Guo; Qiao Xu

Paper Abstract

For extremely high accuracy optical elements, the residual error induced by the superposition of the tool influence function cannot be ignored and leads to medium-high frequency errors. Even though the continuous computer-controlled optical surfacing process is better than the discrete one, which can decrease this error to a certain degree, the error still exists in scanning directions when adopting the raster path. The purpose of this paper is to optimize the parameters used in bonnet polishing to restrain this error. The formation of this error was theoretically demonstrated and will also be further experimentally presented using our newly designed prototype. Orthogonal simulation experiments were designed for the following five major operating parameters (some of them are normalized) at four levels: inner pressure, z offset, raster distance, H-axis speed, and precession angle. The minimum residual error method was used to evaluate the simulations. The results showed the impact of the evaluated parameters on the residual error. The parameters in descending order of impact are as follows: raster distance, z offset, inner pressure, H-axis speed, and precession angle. An optimal combination of these five parameters among the four levels considered, based on the minimum residual error method, was determined.

Paper Details

Date Published: 31 July 2014
PDF: 9 pages
Opt. Eng. 53(7) 075108 doi: 10.1117/1.OE.53.7.075108
Published in: Optical Engineering Volume 53, Issue 7
Show Author Affiliations
Chunjin Wang, Xiamen Univ. (China)
Research Ctr. of Laser Fusion (China)
Wei Yang, Xiamen Univ. (China)
Shiwei Ye, Xiamen Univ. (China)
Zhenzhong Wang, Xiamen Univ. (China)
Bo Zhong, Fine Optical Engineering Research Ctr. (China)
Yinbiao Guo, Xiamen Univ. (China)
Qiao Xu, China Academy of Engineering Physics (China)


© SPIE. Terms of Use
Back to Top