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Optical Engineering

Improving axial resolution in spectral domain low-coherence interferometry through fast Fourier transform harmonic artifacts
Author(s): Marcus Paulo Raele; Luiz Vicente Gomes Tarelho; Carlos Leonardo da Silva Azeredo; Iakyra B. Couceiro; Anderson Z. de Freitas
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Paper Abstract

Low-coherence interferometric setups in the Fourier domain can experience false structures after the Fourier transform procedure due to signal saturation; in fact, these structures are located at multiple frequencies of the original signal, also referred to as harmonics. This study aids in a better understanding of this phenomenon. The aim of the present work was to show that these features can be used to improve differential axial resolution in highly reflective samples. Using an optical coherence tomography system and calibrated step height standards, it was possible to achieve a resolution greater than the light source coherence length.

Paper Details

Date Published: 24 July 2014
PDF: 11 pages
Opt. Eng. 53(7) 073106 doi: 10.1117/1.OE.53.7.073106
Published in: Optical Engineering Volume 53, Issue 7
Show Author Affiliations
Marcus Paulo Raele, Instituto de Pesquisas Energéticas e Nucleares (Brazil)
Luiz Vicente Gomes Tarelho, National Institute of Metrology, Standardization and Industrial Quality (Brazil)
Carlos Leonardo da Silva Azeredo, National Institute of Metrology, Standardization and Industrial Quality (Brazil)
Iakyra B. Couceiro, National Institute of Metrology, Standardization and Industrial Quality (Brazil)
Anderson Z. de Freitas, Instituto de Pesquisas Energéticas e Nucleares (Brazil)


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