Share Email Print

Optical Engineering

Hue-based feature detection for geometry calibration of multiprojector arrays
Author(s): Jin Yan; Guanghong Gong; Chao Tian
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A feature detection method for calibrating multiprojector displays that utilizes a chromatic pattern to avoid the disadvantages of black-and-white features is proposed. Theoretical and experimental analyses implied that our hue-based method was robust to four factors: the ambient light, the non-Lambertian reflection of a display wall, the variation of projectors, and the different positions of cameras. Our method resulted in low rates of misdetection or false detection. Experimental results also indicated that our method was effective to detect weak features. A markerless calibration method was proposed to autoestimate the aspect ratio of the planar display wall and to autocalibrate multiprojectors. Subpixel accuracy was achieved by applying the detected features in the process of geometry calibration of multiprojector displays with embedded processors and cameras.

Paper Details

Date Published: 25 June 2014
PDF: 15 pages
Opt. Eng. 53(6) 063108 doi: 10.1117/1.OE.53.6.063108
Published in: Optical Engineering Volume 53, Issue 6
Show Author Affiliations
Jin Yan, BeiHang Univ. (China)
Guanghong Gong, BeiHang Univ. (China)
Chao Tian, BeiHang Univ. (China)

© SPIE. Terms of Use
Back to Top