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Optical Engineering

Large-field high-resolution Kirkpatrick–Baez amélioré-Kirkpatrick–Baez mixed microscope for multi-keV time-resolved x-ray imaging diagnostics of laser plasma
Author(s): Shengzhen Yi; Baozhong Mu; Xin Wang; Zhong Zhang; Jingtao Zhu; Zhanshan Wang; Pengfei He; Zhurong Cao; Jianjun Dong; Shenye Liu; Yongkun Ding
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Paper Abstract

A large-field high-resolution x-ray microscope was developed for multi-keV time-resolved x-ray imaging diagnostics of laser plasma at the Shenguang-III prototype facility. The microscope consists of Kirkpatrick–Baez amélioré (KBA) bimirrors and a KB single mirror corresponding to the imaging and temporal directions of a streak camera, respectively. KBA bimirrors coated with an Ir single layer were used to obtain high spatial resolutions within the millimeter-range field of view, and a KB mirror coated with Cr/C multilayers was used to obtain a specific spectral resolution around 4.3 keV. This study describes details of the microscope with regard to its optical design, mirror coatings, and assembly method. The experimental imaging results of the grid with 3 to 5 <italic<μ</italic<m spatial resolution are also shown.

Paper Details

Date Published: 21 May 2014
PDF: 7 pages
Opt. Eng. 53(5) 053114 doi: 10.1117/1.OE.53.5.053114
Published in: Optical Engineering Volume 53, Issue 5
Show Author Affiliations
Shengzhen Yi, Tongji Uniiv. (China)
Baozhong Mu, Tongji Univ. (China)
Xin Wang, Tongji Univ. (China)
Zhong Zhang, Tongji Univ. (China)
Jingtao Zhu, Tongji Univ. (China)
Zhanshan Wang, Tongji Univ. (China)
Pengfei He, Tongji Univ. (China)
Zhurong Cao, China Academy of Engineering Physics (China)
Jianjun Dong, China Academy of Engineering Physics (China)
Shenye Liu, China Academy of Engineering Physics (China)
Yongkun Ding, China Academy of Engineering Physics (China)


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