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Optical Engineering • Open Access

Emission and detection of terahertz radiation using two-dimensional plasmons in semiconductor nanoheterostructures for nondestructive evaluations

Paper Abstract

The recent advances in emission and detection of terahertz radiation using two-dimensional (2-D) plasmons in semiconductor nanoheterostructures for nondestructive evaluations are reviewed. The 2-D plasmon resonance is introduced as the operation principle for broadband emission and detection of terahertz radiation. The device structure is based on a high-electron-mobility transistor and incorporates the authors’ original asymmetrically interdigitated dual-grating gates. Excellent THz emission and detection performances are experimentally demonstrated by using InAlAs/InGaAs/InP and/or InGaP/InGaAs/GaAs heterostructure material systems. Their applications to nondestructive material evaluation based on THz imaging are also presented.

Paper Details

Date Published: 27 November 2013
PDF: 14 pages
Opt. Eng. 53(3) 031206 doi: 10.1117/1.OE.53.3.031206
Published in: Optical Engineering Volume 53, Issue 3
Show Author Affiliations
Taiichi Otsuji, Tohoku Univ. (Japan)
Takayuki Watanabe, Tohoku Univ. (Japan)
Stephane Albon Boubanga Tombet, Tohoku Univ. (Japan)
Akira Satou, Tohoku Univ. (Japan)
Victor Ryzhii, Tohoku Univ. (Japan)
Vyacheslav V. Popov, Institute of Radio Engineering and Electronics (Russian Federation)
Wojciech Knap, Univ. Montpellier 2 (France)


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